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A machine vision system for micro-EDM based on linux [6280-129]

著者名:
  • Guo R. ( Harbin Institute of Technology (China) )
  • Zhao W. ( Shanghai Jiao Tong Univ. (China) )
  • Li G. ( Harbin Institute of Technology (China) )
  • Li Z.
  • Zhang Y. ( Shanghai Jiao Tong Univ. (China) )
掲載資料名:
Third International Symposium on Precision Mechanical Measurements
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6280
発行年:
2006
パート:
2
開始ページ:
62803K
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819463517 [0819463515]
言語:
英語
請求記号:
P63600/6280
資料種別:
国際会議録

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