Open modular embedded instrumentation architecture for test and evaluation [6246-03]

Open modular embedded instrumentation architecture for test and evaluation [6246-03]

著者名:

Zhou, R.
Sanza, C. P.
Visnevski, A. N. ( General Electric Global Research (USA) )

掲載資料名:

Defense transformation and network-centric systems : 17-20 April 2006, Kissimmee, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6249

発行年:

2006

開始ページ:

624903

終了ページ:

624903

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819463050 [0819463051]

言語:

英語

請求記号:

P63600/6249

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016259
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Defense transformation and network-centric systems
回次:	2006
会議開催地:	Kissimmee, FL, USA
会議開催年:	2006.04.17-2006.04.20

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