Innovative manufacturing and test technologies for imaging hyperspectral spectrometers [6233-28]

Innovative manufacturing and test technologies for imaging hyperspectral spectrometers [6233-28]

著者名:

Cobb J. M ( Corning Tropel (USA) )
Comstock L. E ( Corning NetOptix (USA) )
Dewa P. G
Dunn M. M
Flint S. D ( Corning Tropel (USA) )

掲載資料名:

Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6233

発行年:

2006

パート:

1

開始ページ:

62330R

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462893 [0819462896]

言語:

英語

請求記号:

P63600/6233

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016243
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery
回次:	2006 : 12th
会議開催地:	Kissimmee, FL, USA
会議開催年:	2006.04.17-2006.04.20

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