Camera for laser beam profiling from 1.0 to 2.0 microns wavelength with an indium gallium arsenide based focal plane array [6206-04]

Camera for laser beam profiling from 1.0 to 2.0 microns wavelength with an indium gallium arsenide based focal plane array [6206-04]

著者名:

Brubaker R. M.
Ettenberg M. H.
Onat B. M.
Masaun N.
Dixon P. ( Sensors Unlimited Goodrich Corp. (USA) )

掲載資料名:

Infrared Technology and Applications XXXII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6206

発行年:

2006

パート:

1

開始ページ:

620604

終了ページ:

620605

総ページ数:

2

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462626 [0819462624]

言語:

英語

請求記号:

P63600/6206

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016217
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Infrared Technology and Applications
回次:	2006 : 32th
会議開催地:	Kissimmee, FL, USA
会議開催年:	2006.04.17-2006.04.21

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