Thermography and neural networks for SRAM voltage stress prediction [6205-27]

Thermography and neural networks for SRAM voltage stress prediction [6205-27]

著者名:

Hsieh S.-J.
Sharma K. ( Texas A&M Univ. (USA) )

掲載資料名:

Thermosense XXVIII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6205

発行年:

2006

開始ページ:

62050Q

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462619 [0819462616]

言語:

英語

請求記号:

P63600/6205

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016216
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Thermosense
回次:	2006 : 28th
会議開催地:	Kissimmee, FL, USA
会議開催年:	2006.04.17-2006.04.20

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