Damage detection of wooden. buildings using chaos analysis and system identification [6174-57]

Damage detection of wooden. buildings using chaos analysis and system identification [6174-57]

著者名:

Hijikata, K. ( Keio Univ. (Japan) )
Mita, A. ( Keio Univ. (Japan) )

掲載資料名:

Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6174

発行年:

2006

パート:

1

開始ページ:

61741O

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819462275 [0819462276]

言語:

英語

請求記号:

P63600/6174

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016205
シリーズID:	PA00000029
会議名:	Smart structures and materials
回次:	2006
会議開催地:	San Diego, CA, USA
会議開催年:	2006.02.27-2006.03.02

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