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Structural tests using a MEMS acoustic emission sensor [6174-02]

著者名:
Oppenheim, I. J. ( Carnegie Mellon Univ. (USA) )
Greve, D. W. ( Carnegie Mellon Univ. (USA) )
Ozevin, D. ( Physical Acoustics Corp. (USA) and Lehigh Univ. (USA) )
Hay, D. R. ( TISEC Inc. (Canada) )
Hay, T. R. ( WaveslnSolids LLC (USA) )
Pessiki, S. P. ( Lehigh Univ. (USA) )
Tyson, N. L. ( Camegie Mellon Univ. (USA) )
さらに 2 件
掲載資料名:
Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6174
発行年:
2006
パート:
1
開始ページ:
617404
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462275 [0819462276]
言語:
英語
請求記号:
P63600/6174
資料種別:
国際会議録

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