Optical system integration of near infrared laser altimeter [6150-191]

Optical system integration of near infrared laser altimeter [6150-191]

著者名:

Zhang, H. ( Shanghai Institute of Technical Physics CAS (China) )
Wang, J. ( Shanghai Institute of Technical Physics CAS (China) )
Shu, R. ( Shanghai Institute of Technical Physics CAS (China) )
Hu, Y. ( Shanghai Institute of Technical Physics CAS (China) )
Fang K ( Shanghai Institute of Technical Physics CAS (China) )

掲載資料名:

2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6150

発行年:

2006

パート:

2

開始ページ:

61503E

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461896 [081946189X]

言語:

英語

請求記号:

P63600/6150

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016182
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Optical Manufacturing and Testing Technologies
回次:	2005 : 2nd
会議開催地:	Xian, China
会議開催年:	2005.11.02-2005.11.05

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