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Coma aberration measurement by lateral image displacements at different defocus positions [6150-31]

著者名:
  • Ma, M. ( Shanghai Institute of Optics and Fine Mechanics (China) and Chinese Academy of Sciences (China) )
  • Wang, X. ( Shanghai Institute of Optics and Fine Mechanics (China) and Chinese Academy of Sciences (China) )
  • Wang, F. ( Shanghai Institute of Optics and Fine Mechanics (China) and Chinese Academy of Sciences (China) )
  • Shi, W. ( Shanghai Institute of Optics and Fine Mechanics (China) and Chinese Academy of Sciences (China) )
  • Zhang, D. ( Shanghai Institute of Optics and Fine Mechanics (China) and Chinese Academy of Sciences (China) )
掲載資料名:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6150
発行年:
2006
パート:
1
開始ページ:
615003
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461896 [081946189X]
言語:
英語
請求記号:
P63600/6150
資料種別:
国際会議録

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