Response of a Csl/amorphous-Si flat panel detector as function of incident x-ray angle [6142-123]

Response of a Csl/amorphous-Si flat panel detector as function of incident x-ray angle [6142-123]

著者名:

Tkaczyk, J. E. ( General Electric Research (USA) )
Claus, B. ( General Electric Research (USA) )
Gonzalez Trotter, D. ( General Electric Research (USA) )
Eberhard, J. W. ( General Electric Research (USA) )

掲載資料名:

Medical Imaging 2006: Physics of Medical Imaging

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6142

発行年:

2006

パート:

3

開始ページ:

61423F

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

1.60574e+007

ISBN:

9780819461858 [0819461857]

言語:

英語

請求記号:

P63600/6142

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016176
シリーズID:	PA00000029
会議名:	Medical imaging
回次:	2006
会議開催地:	San Diego, CA, USA
会議開催年:	2006.02.12-2006.02.16

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