Characterization of highly photorefractive and active silica-germania sputtered thin films [6123-17]
- 著者名:
Berneschi, S. ( N. Carrara Institute of Applied physics, IFAC-CNR (Italy) and Bologna Univ. (Italy) ) Brenci, M. ( N. Carrara Institute of Applied Phscics, IFAC-CNR(Italy) ) Chiasera. A. ( Institute of Photonics and Nanotechnologies, IFN-CNR (Italy) ) Ferrair M ( Institute of Photonics and Nanotechnologies, IFN-CNR (Italy) ) Nunzi Conti, G. ( N. Carrara Institute of Applied Phscics, IFAC-CNR(Italy) ) Pelli, S. ( N. Carrara Institute of Applied Phscics, IFAC-CNR(Italy) ) Sebastiani, S. ( N. Carrara Institute of Applied Phscics, IFAC-CNR(Italy) ) Tosello, C. ( Univ. of Trento (Italy) ) Righini, G. C. ( N. Carrara Institute of Applied Phscics, IFAC-CNR(Italy) ) - 掲載資料名:
- Integrated Optics: Devices, Materials, and Technologies X
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6123
- 発行年:
- 2006
- 開始ページ:
- 61230G
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461650 [0819461652]
- 言語:
- 英語
- 請求記号:
- P63600/6123
- 資料種別:
- 国際会議録
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