Surtace spatial profiles of defects in GaN (Invited Paper) [6121-14]
- 著者名:
Johnstone, D. K. ( SEMETROL (USA) ) Akarca-Biyikli S ( Virginia Commonwealth Univ. (USA) ) Xie, J. ( Virginia Commonwealth Univ. (USA) ) Fu, Y. ( Virginia Commonwealth Univ. (USA) ) Litton, C. W. ( Air Force Research Lab. (USA) ) Morkoc H ( Virginia Commonwealth Univ. (USA) ) - 掲載資料名:
- Gallium Nitride Materials and Devices
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6121
- 発行年:
- 2006
- 開始ページ:
- 61210N
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461636 [0819461636]
- 言語:
- 英語
- 請求記号:
- P63600/6121
- 資料種別:
- 国際会議録
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