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Characterization of GaN epitaxial films grown on SiNx and TiNx porous network templates (Invited Paper) [6121-11]

著者名:
Xie, J. ( Virginia Commonwealth Univ. (USA) )
Fu, Y. ( Virginia Commonwealth Univ. (USA) )
Ozgur, U. ( Virginia Commonwealth Univ. (USA) )
Moon, Y. T. ( Virginia Commonwealth Univ. (USA) )
Yun, F. ( Virginia Commonwealth Univ. (USA) )
Morkoc, H. ( Virginia Commonwealth Univ. (USA) )
Everitt, H. O. ( Duke Univ. (USA) )
Sagar, A. ( Carnegie Mellon Univ. (USA) )
Feenstra, R. M. ( Carnegie Mellon Univ. (USA) )
Inoki, C. K. ( Univ of Albany (USA) )
Kuan, T. S. ( Univ of Albany (USA) )
Zhou, L ( Arizona State Univ (USA) )
Smith D. J ( Arizona State Univ (USA) )
さらに 8 件
掲載資料名:
Gallium Nitride Materials and Devices
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6121
発行年:
2006
開始ページ:
61210B
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461636 [0819461636]
言語:
英語
請求記号:
P63600/6121
資料種別:
国際会議録

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