Optimum conditions for high-quality 3D reconstruction in confocal scanning microscopy [6090-32]
- 著者名:
- Kim, T. ( Korea Advanced Institute of Science and Technology (South Korea) )
- Lee, S. ( Korea Advanced Institute of Science and Technology (South Korea) )
- Gweon, D. G. ( Korea Advanced Institute of Science and Technology (South Korea) )
- Seo, J. ( Samsung Electronics Co., Ltd. (South Korea) )
- 掲載資料名:
- Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6090
- 発行年:
- 2006
- 開始ページ:
- 60900W
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819461322 [0819461326]
- 言語:
- 英語
- 請求記号:
- P63600/6090
- 資料種別:
- 国際会議録
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