Boundary detection of projected fringes on surface with inhomogeneous reflectance function [6070-03]
- 著者名:
Cheng J ( The Chinese Univ. of Hong Kong (Hong Kong China); ) Chung R ( The Chinese Univ. of Hong Kong (Hong Kong China); ) Lam E Y ( The Univ. of Hong Kong (Hong Kong China); ) Fung K S M ( ASM Assembly Automation Ltd. (Hong Kong China) ) Wang F ( ASM Assembly Automation Ltd. (Hong Kong China) ) Leung W H ( ASM Assembly Automation Ltd. (Hong Kong China) ) - 掲載資料名:
- Machine Vision Applications in Industrial Inspection XIV
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6070
- 発行年:
- 2006
- 開始ページ:
- 607003
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461100 [0819461105]
- 言語:
- 英語
- 請求記号:
- P63600/6070
- 資料種別:
- 国際会議録
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4
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Surface orientation recovery of specular micro-surface via binary pattern projection [6070-25]
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