Study on Fourier transforms profilometry based on bi-color projecting [6027-55]
- 著者名:
- 掲載資料名:
- ICO20: Optical Information Processing
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6027
- 発行年:
- 2006
- パート:
- 1
- 開始ページ:
- 60271J
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819460585 [0819460583]
- 言語:
- 英語
- 請求記号:
- P63600/6027
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
国際会議録
Fourier transform profilometry based on a fringe pattern with two frequency components [6027-54]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |