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A novel method for measuring the thickness of optical wave plate [6024-47]

著者名:
  • Feng W.
  • Lin L. ( Shanghai Institute of Optics and Fine Mechanics (China) )
掲載資料名:
ICO20 : optical devices and instruments : 21-26 August, 2005, Changchun, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6024
発行年:
2005
開始ページ:
60241B
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460554 [0819460559]
言語:
英語
請求記号:
P63600/6024
資料種別:
国際会議録

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