Resilience in all-optical label switching networks: a node dimensioning point of view [6022-79]

Resilience in all-optical label switching networks: a node dimensioning point of view [6022-79]

著者名:

Van Caenegem R.
Colle D.
Pickavet M.
Demeester P. ( Ghent Univ. (Belgium) )

掲載資料名:

Network Architectures, Management, and Applications III

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6022

発行年:

2005

パート:

1

開始ページ:

602228

終了ページ:

602228

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460530 [0819460532]

言語:

英語

請求記号:

P63600/6022

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016057
シリーズID:	PA00000029
会議名:	APOC : Asia Communications and Photonics
回次:	2005
会議開催地:	Shanghai, China
会議開催年:	2015.11.07-2015.11.10

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