Imaging ellipsometry combined with surface for real-time biospecific interaction analysis [6008-51]

Imaging ellipsometry combined with surface for real-time biospecific interaction analysis [6008-51]

著者名:

Chegal W.
Cho H. M.
Cho Y. J. ( Korea Research Institute of Standards and Science (South Korea) )
Kim Y. P.
Kim H. S. ( Korea Advanced Institute of Science and Technology (South Korea) )

掲載資料名:

Nanosensing: Materials and Devices II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6008

発行年:

2005

開始ページ:

60081G

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460325 [081946032X]

言語:

英語

請求記号:

P63600/6008

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016043
シリーズID:	PA00000029
会議名:	Optics East : Nanosensing
回次:	2005 : 2nd
会議開催地:	Boston, MA, USA
会議開催年:	2005.10.23-2005.10.26

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