Blank Cover Image

Growth and characterization of single crystal semiconductor Ga2O3 nanowires and nanoribbons for sensing applications (Invited Paper) [6008-12]

著者名:
掲載資料名:
Nanosensing: Materials and Devices II
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6008
発行年:
2005
開始ページ:
60080C
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460325 [081946032X]
言語:
英語
請求記号:
P63600/6008
資料種別:
国際会議録

類似資料:

Prokes, S. M., Park, H. D., Glembocki, O. J.

SPIE - The International Society of Optical Engineering

Prokes, S. M., Glembocki, O. J.

MRS - Materials Research Society

Glembocki O. J., Prokes S. M., Szmacinski H., Liu J., Kub F., Kub C.

SPIE - The International Society of Optical Engineering

Glembocki, O.J., Gaskill, D.K., Prokes, S.M., Pearton, S.W.

Materials Research Society

Prokes, S. M., Arnold, S.

SPIE - The International Society of Optical Engineering

Fan Z., Lu J. G.

SPIE - The International Society of Optical Engineering

S. M. Prokes, H. D. Park, O. J. Glembocki, D. Alexson, R. W. Rendell

Society of Photo-optical Instrumentation Engineers

Kowalsky W., Rabe T., Schneider D., Johannes H.-H., Karmutsch C., Gerken M., Lemmer U., Wang J., Weimann T., Hinze P., …

SPIE - The International Society of Optical Engineering

O. J. Glembocki, R. W. Rendell, S. M. Prokes, D. A. Alexson, M. A. Mastro

Society of Photo-optical Instrumentation Engineers

Kim, H.W.

Trans Tech Publications

Zhou C., Li C., Curreli M., Lin H., Ishikawa F. N., Datar R., Cote R. J., Thompson M. E.

SPIE - The International Society of Optical Engineering

Glembocki, O.J., Prokes, S.M., Kennedy, T.A., Rajagopal, A.K.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12