The response time of GaN photoconductive detector under various ultraviolet-radiation intensities [5964-38]

The response time of GaN photoconductive detector under various ultraviolet-radiation intensities [5964-38]

著者名:

Xu, J.
Tang, Y.
Li, X.
Gong, H. ( Shanghai Institute of Technical Physics, CAS (China) )
Zhao, D. ( Institute of Semiconductor, CAS (China) )

掲載資料名:

Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5964

発行年:

2005

開始ページ:

59640Z

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459824 [0819459828]

言語:

英語

請求記号:

P63600/5964

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00016001
シリーズID:	PA00000029
会議名:	SPIE Optical Systems Design : Detectors and associated signal processing
回次:	2005 : 2nd
会議開催地:	Jena, Germany
会議開催年:	2005.09.13-2005.09.14

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