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High reflectivity measurement with cavity ring-down technique [5963-89]

著者名:
掲載資料名:
Advances in optical thin films II : 13-15 September 2005, Jena, Germany
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5963
発行年:
2005
開始ページ:
59632F
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459817 [081945981X]
言語:
英語
請求記号:
P63600/5963
資料種別:
国際会議録

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