Modelling control processes using only positive values [5916-26]

Modelling control processes using only positive values [5916-26]

著者名:

Hernandez Z., A.
Camacho N., O.
Ya-ez Marquez, C.
Diaz de Leon S., J.. L ( Computer Research Center, I. P. N.. (Mexico) )

掲載資料名:

Mathematical Methods in Pattern and Image Analysis

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5916

発行年:

2005

開始ページ:

59160O

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459213 [0819459216]

言語:

英語

請求記号:

P63600/5916

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015954
シリーズID:	PA00000029
会議名:	Optics & Photonics : Mathematical Methods in Pattern and Image Analysis
回次:	2005
会議開催地:	San Diego, CA, USA
会議開催年:	2005.08.03-2005.08.04

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