Use of a local regularity analysis by a wavelet analysis for glitch detection [5909-72]

Use of a local regularity analysis by a wavelet analysis for glitch detection [5909-72]

著者名:

Ordenovic, C.
Surace, C. ( Lab. D’Astrophysique de Marseille (France) )
Torresani, B. ( Lab. D’Analyse, de Topologie et de Probabilities (France) )
Llebaria, A.
Baluteau, J. P. ( Lab. D’Astrophysique de Marseille (France) )

掲載資料名:

Applications of digital image processing XXVIII : 2-4 August 2005, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5909

発行年:

2005

開始ページ:

59091U

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459145 [0819459143]

言語:

英語

請求記号:

P63600/5909

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015947
シリーズID:	PA00000029
会議名:	Optics & Photonics : Applications of digital image processing
回次:	2005 : 28th
会議開催地:	San Diego, CA, USA
会議開催年:	2005.08.02-2005.08.04

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