Automation, operation, and data analysis in the cryogenic, high accuracy, refraction measuring system (CHARMS) [5904-26]

Automation, operation, and data analysis in the cryogenic, high accuracy, refraction measuring system (CHARMS) [5904-26]

著者名:

Frey, B. J.
Leviton, D. B. ( NASA Goddard Space Flight Ctr. (USA) )

掲載資料名:

Cryogenic optical systems and instruments XI : 1-2 August 2005 San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5904

発行年:

2005

開始ページ:

59040P

出版情報:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459091 [0819459097]

言語:

英語

請求記号:

P63600/5904

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015943
シリーズID:	PA00000029
会議名:	Optics & Photonics : Cryogenic optical systems and instruments
回次:	2005 : 11th
会議開催地:	San Diego, CA, USA
会議開催年:	2005.08.01-2005.08.02

類似資料:

1 国際会議録 Thermal design considerations for the cryogenic high-accuracy refraction measuring system (CHARMS) Leviton, D.B., Frey, B.J. SPIE - The International Society of Optical Engineering	7 国際会議録 Cryogenic temperature-dependent refractive index measurements of N-BK7, BaLKN3, SF15, and E-SF03 B. J. Frey, D. B. Leviton, T. J. Madison, Q. Gong, M. Tecza Society of Photo-optical Instrumentation Engineers
2 国際会議録 Cryogenic High-Accuracy Refraction Measuring System (CHARMS): a new facility for cryogenic infrared through far-ultraviolet refractive index measurements Leviton, D. B., Frey, B. J. SPIE - The International Society of Optical Engineering	8 国際会議録 Temperature-dependent absolute refractive index measurements of synthetic fused silica [6273-99] Leviton D. B, Frey B. J SPIE - The International Society of Optical Engineering
3 国際会議録 High accuracy, absolute, cryogenic, refractive index measurements of infrared lens materials for JWST NIRCam using CHARMS [5904-25] Leviton, D. B., Frey, B. J., Kvamme, E. T. SPIE - The International Society of Optical Engineering	9 国際会議録 Lithium fluoride material properties as applied on the NIRCam instrument [5904-24] Kvamme, E. T., Earthman, J. C., Leviton, D. B., Frey, B. J. SPIE - The International Society of Optical Engineering
4 国際会議録 Design of a cryogenic high-accuracy absolute prism refractometer for infrared through far-ultraviolet potical materials Leviton, D. B., Frey, B. J. SPIE-The International Society for Optical Engineering	10 国際会議録 Temperature-dependent refractive index of silicon and germanium [6273-98] Frey B. J, Leviton D. B, Madison T. J SPIE - The International Society of Optical Engineering
5 国際会議録 Cryogenic high-accuracy absolute prism refractometer for infrared through far-ultraviolet optical materials: implementation and initial results Frey, B.J., Henry, R.M., Leviton, D.B., Quijada, M.A. SPIE - The International Society of Optical Engineering	11 国際会議録 Temperature-dependent refractive index of CaF₂ and Infrasil 301 D. B. Leviton, B. J. Frey, T. J. Madison Society of Photo-optical Instrumentation Engineers
6 国際会議録 Calibration of the ZnSe pre-disperser on ESO's cryogenic IR echelle spectrograph (CRIRES): comparison of the first results from CRIRES and the laboratory data … Florian Kerber, Bradley J. Frey, Douglas B. Leviton, Paul Bristow, Hans-Ulrich Kaufl, Jean Francois Pirard, Michael R. … SPIE - The International Society of Optical Engineering	12 国際会議録 Sub-arcsecond differential deflectometry to measure thermally induced distortions of the Swift optical bench Leviton, D.B., Frey, B.J., Madison, L.E., Parker, J.A., Sheinman, O.E. SPIE-The International Society for Optical Engineering

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