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Specimen-induced aberrations and adaptive optics for microscopy [5894-03]

著者名:
掲載資料名:
Advanced wavefront control : methods, devices, and applications III : 31 July-2 August 2005, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5894
発行年:
2005
開始ページ:
589403
終了ページ:
599403
総ページ数:
10001
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458995 [0819458996]
言語:
英語
請求記号:
P63600/5894
資料種別:
国際会議録

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