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Method for absolute measurements of reflectance and transmittance of specular samples with STAR GEM [5880-34]

著者名:
Kawate, E. ( National Institute of Advanced Industrial Science and Technilogy (Japan) )  
掲載資料名:
Optical Diagnostics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5880
発行年:
2005
開始ページ:
58800X
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458858 [0819458856]
言語:
英語
請求記号:
P63600/5880
資料種別:
国際会議録

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