A comparison study on the measurement of nanoparticles [5879-39]

A comparison study on the measurement of nanoparticles [5879-39]

著者名:

Wang, C. -Y.
Pan, S. -P.
Peng, G. -S.
Tsai, J. -H. ( Industrial Technology Research Institute (Taiwan) )

掲載資料名:

Recent Developments in Traceable Dimensional Measurements III

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5879

発行年:

2005

開始ページ:

587910

終了ページ:

587910

総ページ数:

1

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458841 [0819458848]

言語:

英語

請求記号:

P63600/5879

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015918
シリーズID:	PA00000029
会議名:	Optics & Photonics : Recent Developments in Traceable Dimensional Measurements
回次:	2005 : 3rd
会議開催地:	San Diego, CA, USA
会議開催年:	2005.07.31-2005.08.01

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