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Application of the photoelastic fornography to three-dimensional measurement of birefringence in anisotropic microobjects [5878-19]

著者名:
掲載資料名:
Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5878
発行年:
2005
開始ページ:
58780J
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458834 [081945883X]
言語:
英語
請求記号:
P63600/5878
資料種別:
国際会議録

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