Blank Cover Image

Design and test of a differential scanning stage system for a x-ray nanoprobe instrument (Invited Paper) [5877-14]

著者名:
Shu, D.
Maser, J.
Halt, M.
Lai, B.
Vogt. S.
Wang, Y.
Preissner, C. ( Argonne National Lab (USA); )
Han, Y. ( Argonne National Lab. (USA) and Illinois Institute of Technology (USA); )
B. Tieman,
Winarski, R. ( Argonne National Lab. (USA); )
Smalyanitskiy, A ( Argonne National Lab. (USA) and Illinois Institute of Technology (USA); )
Stephenson, G. B. ( Argonne National Lab. (USA) )
さらに 7 件
掲載資料名:
Optomechanics 2005 : 3-4 August 2005, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5877
発行年:
2005
開始ページ:
58770E
出版情報:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458827 [0819458821]
言語:
英語
請求記号:
P63600/5877
資料種別:
国際会議録

類似資料:

1 国際会議録 X-ray tomography system, automation, and remote access at beamline 2-BM of the Advanced Photon Source (Invited Paper) [6318-20]

De Carlo, F., Xiao, X., Tieman, B.

SPIE - The International Society of Optical Engineering
7 国際会議録 Precision mechanical design of an UHV-compatible artificial channel-cut x-ray monochromator

D. Shu, S. Narayanan, A. Sandy, M. Sprung, C. Preissner

Society of Photo-optical Instrumentation Engineers
2 国際会議録 Multilayer Laue lenses as high-resolution x-ray optics (Invited Paper)

Maser, J., Stephenson, G.B., Vogt, S., Yun, W., Macrander, A., Kang, H.C., Liu, C., Conley, R.

SPIE - The International Society of Optical Engineering
8 国際会議録 Enhancement ot the vibration stability of a microdiffraction goniometer

Lee, S.-H., Preissner, C., Lai, B.P., Cai, Z., Shu, D.

SPIE-The International Society for Optical Engineering
3 国際会議録 Design and performance of the 2-ID-B scanning x-ray microscope

McNulty, I., Frigo, S.P., Retsch, C.C., Wang, Y., Feng, Y.P., Qian, Y., Trakhtenberg, E., Tieman, B., Cha, B.-C., …

SPIE
9 国際会議録 Combined nanoprobes for scanning probe microscopy: laser technology for processing and testing

V. P. Veiko, A. O. Golubok, Z. Zuong, N. V. Varkentina, E. B. Yakovlev

Society of Photo-optical Instrumentation Engineers
4 国際会議録 Vibration diagnosis and remediation design for an x-ray optics stitching interferometer system

Preissner, C.A., Assoufid, L., Shu, D.

SPIE - The International Society of Optical Engineering
10 国際会議録 Mechanical design of a high-resolution x-ray powder diffractometer at the Advanced Photon Source

D. Shu, P. L. Lee, C. Preissner, M. Ramanathan, M. Beno

Society of Photo-optical Instrumentation Engineers
5 国際会議録 Tapered tilted linear zone plates for focusing hard x-rays

Ocola, L.E., Maser, J., Vogt, S., Lai, B., Divan, R., Stephenson, G.B.

SPIE - The International Society of Optical Engineering
11 国際会議録 High-throughput x-ray microtomography system at the Advanced Photon Source beamline 2-BM

Carlo, F.De, Tieman, B.

SPIE - The International Society of Optical Engineering
6 国際会議録 Parameter identification for joint elements in a revolute-joint detector manipulator [5877-18]

Preissner, C., Shu, D., Royston, T. J.

SPIE - The International Society of Optical Engineering
12 国際会議録 Fiber optic chemical sensing (Invited Paper) [5998-14]

Pickrell, G., Peng, W., Alfelli, B., Wang, A.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12