Blank Cover Image

The evaluation of particle counting efficacy of the new optical scattering method detecting the fluorescence for the particle number concentration standard in liquid [5856-129]

著者名:
掲載資料名:
Optical Measurement Systems for Industrial Inspection IV
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5856
発行年:
2005
パート:
2
開始ページ:
994
終了ページ:
1002
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458568 [0819458562]
言語:
英語
請求記号:
P63600/5856
資料種別:
国際会議録

類似資料:

Sakaguchi, T., Ehara, K.

SPIE-The International Society for Optical Engineering

Diwan, Y. C., Lolla, K. R.

SPIE - The International Society of Optical Engineering

Sakaguchi,K., Sekine,T., Shimada,H.

SPIE - The International Society for Optical Engineering

Masuda,K., Takashima,T.

SPIE-The International Society for Optical Engineering

Zimmerman, B.E., Colle, R., Cessna, J.T., Broda, R., Cassette, P.

American Chemical Society

Thunberg, S.J., Francke, T., Egerstroem, J., Eklund, M., Ericsson, L., Kristoffersson, T., Peskov, V.N., Rantanen, J., …

SPIE-The International Society for Optical Engineering

T. Ehara, K. Sasaki, M. Abe, T. Nakanishi

Trans Tech Publications

Schmidt, K., Wauer, J., Rother, T.

SPIE-The International Society for Optical Engineering

J. Eberhart, M. Frentzen, M. Thoms

SPIE - The International Society of Optical Engineering

J. Yang, F. Gu, G. Peng, B. Bian, J. Lu

Society of Photo-optical Instrumentation Engineers

Y. Iwamoto, K. Awazu, S. Suzuki, T. Ohshima, M. Sawa, H. Sakaguchi, Y. Tano, M. Ohji

SPIE - The International Society of Optical Engineering

Su, C., Sarkar, T. K., Salazar, M.

ESA Publications Division

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12