The laser-scanning confocal vibrometer microscope [5856-53]
- 著者名:
- Rembe, C.
- Drabenstedt, A. ( Polytec GmbH (Germany) )
- 掲載資料名:
- Optical Measurement Systems for Industrial Inspection IV
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5856
- 発行年:
- 2005
- パート:
- 2
- 開始ページ:
- 698
- 終了ページ:
- 709
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458568 [0819458562]
- 言語:
- 英語
- 請求記号:
- P63600/5856
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
国際会議録
Measuring 3D geometries of microstructures with the laser-scanning confocal vibrometer microscope
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8
国際会議録
Spherical aberration cancellation in a polarized photon-pairs confocal laser scanning microscope
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SPIE - The International Society of Optical Engineering |
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SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
11
国際会議録
A New Confocal Scanning Laser MACROscope/Microscope Applied to the Characterization of Solar Cells
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SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |