Microlenses metrology with digital holographic microscopy [5856-37]

Microlenses metrology with digital holographic microscopy [5856-37]

著者名:

Charriere, F.

Kuhn, J.

Colomb, T.

Montfort, F. ( Ecole Polytechnique Federale de Lausanne (Switzerland) )

Cuche, E.

Emery, Y. ( Lyncee Tec SA (Switzerland) )

Weible, K. ( SUSS MicroOptics SA (Switzerland) )

Depeursinge, C. D. ( Lyncee Tec SA (Switzerland) )

さらに 3 件

掲載資料名:

Optical Measurement Systems for Industrial Inspection IV

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5856

発行年:

2005

パート:

1

開始ページ:

447

終了ページ:

453

総ページ数:

7

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458568 [0819458562]

言語:

英語

請求記号:

P63600/5856

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015895
シリーズID:	PA00000029
会議名:	Optical Metrology : Optical Measurement Systems for Industrial Inspection
回次:	2005 : 4th
会議開催地:	Munich, Germany
会議開催年:	2005.06.13-2005.06.17

類似資料:

1 国際会議録 Digital holographic microscopy applied to metrology Depeursinge, C. D., Charriere, F., Marian, A. M., Montfort, F., Colomb, T., Kuhn, J., Cuche, E., Emery, Y., Marquet, P., … SPIE - The International Society of Optical Engineering	7 国際会議録 Digital holographic microscopy: a new optical imaging technique to investigate cellular dynamics [6191-31] Marquet P., Rappaz B., Colomb T., Charriere F., Kuhn J., Emery Y., Cuche E., Depeursinge C., Magistertti P. SPIE - The International Society of Optical Engineering
2 国際会議録 Multi-wavelength digital holographic microscopy for sub-micron topography of reflecting specimens F. Montfort, F. Charriere, J. Kuhn, T. Colomb, E. Cuche, Y. Emery, P. Marquet, C. Depeursinge SPIE - The International Society of Optical Engineering	8 国際会議録 Dual-wavelength digital holographic microscopy with sub-nanometer axial accuracy J. Kühn, F. Charriere, T. Colomb, F. Montfort, E. Cuche Society of Photo-optical Instrumentation Engineers
3 国際会議録 Digital holographic microscopy for nanometric quality control of micro-optical components J. Kuhn, F. Charriere, T. Colomb, E. Cuche, Y. Emery, C. Depeursinge SPIE - The International Society of Optical Engineering	9 国際会議録 Use of digital holographic microscopy in tomography [6191-25] Charriere F., Montfrt F., Kuhn J., Colomb T., Marian A., Cuche E., Marquet P., Depeursinge C. SPIE - The International Society of Optical Engineering
4 国際会議録 Measurements of corner cubes microstructures by high-magnification digital holographic microscopy [6188-04] Kuhn, J., Cuche, E., Emery, Y., Colomb, T., Charriere, F., Montfort, F., Botkine, M., Aspert, N., Depeursinge, C. SPIE - The International Society of Optical Engineering	10 国際会議録 Sub-cellular quantitative optical diffraction tomography with digital holographic microscopy F. Charriere, J. Kuhn, T. Colomb, E. Cuche, P. Marquet, C. Depeursinge SPIE - The International Society of Optical Engineering
5 国際会議録 Digital holography microscopy (DHM): fast and robust systems for industrial inspection with interferometer resolution [5856-70] Emery, Y., Cuche, E., Marquet, F., Aspert, N., Marquet, P., Kuhn, J., Botkine, M., Colomb, T., Montfort, F., Charriere, … SPIE - The International Society of Optical Engineering	11 国際会議録 Real-time dual-wavelength digital holographic microscopy with a single hologram J. Kuehn, T. Colomb, F. Montfort, F. Charriere, C. Depeursinge SPIE - The International Society of Optical Engineering
6 国際会議録 Digital holographic microscopy (DHM) for metrology and dynamic characterization of MEMS and MOEMS [6186-22] Emery Y., Cuche E., Marquet F., Aspert N., Marquet P., Kuhn J., Botkine M., Colomb T., Montfort F., Charriere F., … SPIE - The International Society of Optical Engineering	12 国際会議録 Automatic procedure for aberrations compensation in digital holographic microscopy [6188-05] Colomb, T., Kuhn, J., Cuche, E., Montfort, F., Marian, A., Aspert, N., Marquet, P., Depeursinge, C. SPIE - The International Society of Optical Engineering

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