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A compact electronic speckle pattern interferometry system using a photopolymer reflection holographic optical element [5856-18]

著者名:
Guntaka, S. R.
Raghavendra, J.
Toal, V.
Naydenova, I.
Martin, S. ( Dublin Institute of Technology (Ireland) )
Mintova, S. ( Univ. of Munich (Germany) )
さらに 1 件
掲載資料名:
Optical Measurement Systems for Industrial Inspection IV
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5856
発行年:
2005
パート:
1
開始ページ:
152
終了ページ:
157
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458568 [0819458562]
言語:
英語
請求記号:
P63600/5856
資料種別:
国際会議録

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