Blank Cover Image

Non-contact damage monitoring by laser AE technique [5852-34]

著者名:
掲載資料名:
Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5852
発行年:
2005
パート:
1
開始ページ:
214
終了ページ:
219
総ページ数:
6
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458520 [081945852X]
言語:
英語
請求記号:
P63600/5852
資料種別:
国際会議録

類似資料:

Nishinoiri, S., Nozawa, K., Enoki, M.

Trans Tech Publications

Okandan,M., Fonash,S.J., Werking,J.

SPIE-The International Society for Optical Engineering

Boehringer, M., Hauber, J., Passefort, S., Eason, K.

SPIE-The International Society for Optical Engineering

Marinskiy, D., Lagowski, J., Wilson, M., Savtchouk, A., Jastrzebski, L., DeBusk, D.

MRS-Materials Research Society

Bohringer, M., Hauber, J., Passefort, S., Eason, K.

Electrochemical Society

Kuang, K. S. C., Quek, S. T., Maalej, M.

SPIE - The International Society of Optical Engineering

Jian, X., Dixon, S., Edwards, R. S.

SPIE - The International Society of Optical Engineering

Brownjohn, J. M. W., Moyo, P., Omenzetter, P., Chakraboorty, S.

SPIE - The International Society of Optical Engineering

Nambu, S., Enoki, M.

Trans Tech Publications

M. A. Noras, W. A. Maryniak

SPIE - The International Society of Optical Engineering

Sakagami, Y., Yoshida, H., Ito, R., Terasawa, T., Fuseya, T., Awano, K., Mayumi, F., Murase, K., Kato, H., Sato, S., …

SPIE - The International Society of Optical Engineering

Cakmak M., Serhatkulu T. F., Graves M., Galay J.

Society of Plastics Engineers, Inc. (SPE)

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12