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Hausdorif distance based PCB inspection system with defect classification [6000-08]

著者名:
Chen, C.-J.
Lai, S.-H.
Lee, W.-H. ( National Tsing Hua Univ. (Taiwan) )
Lin, C.-Y.
Ku, T.
Chen, C.-H.
Chung, Y.-C. ( Industrial Technology Research Institute (Taiwan) )
さらに 2 件
掲載資料名:
Two- and three-dimensional methods for inspection and metrology III : 24-26 October, 2005, Boston, Massachusetts, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6000
発行年:
2005
開始ページ:
600008
終了ページ:
600008
総ページ数:
1
出版情報:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460240 [0819460249]
言語:
英語
請求記号:
P63600/6000
資料種別:
国際会議録

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