Sensor fault diagnosis based on discrete wavelet transform and BP neural network [5998-20]

Sensor fault diagnosis based on discrete wavelet transform and BP neural network [5998-20]

著者名:

Liu, Q.
Jiang, X. ( Wuhan Univ. of Technology (China) )

掲載資料名:

Sensors for Harsh Environments II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5998

発行年:

2005

開始ページ:

59980J

出版情報:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460226 [0819460222]

言語:

英語

請求記号:

P63600/5998

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015888
シリーズID:	PA00000029
会議名:	Optics East : Sensors for Harsh Environments
回次:	2005 : 2nd
会議開催地:	Boston, MA, USA
会議開催年:	2005.10.23-2005.10.24

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