Blank Cover Image

Defect-related Issues in High-Dielectics

著者名:
Pantelides, S. T
Evans, M. H
Fleetwood, D. M
Gusev, E. P
Joannopoulos, J. D
Lu, Z
Pennycook, S. J
Rashkeev, S. N
Schrimpf, R. D
Tsetseris, L
さらに 5 件
掲載資料名:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
シリーズ名:
NATO science series. Series 2, Mathematics, physics and chemistry
シリーズ巻号:
220
発行年:
2006
開始ページ:
189
終了ページ:
203
総ページ数:
15
出版情報:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
言語:
英語
請求記号:
N17050/220
資料種別:
国際会議録

類似資料:

1 国際会議録 Field-Induced Reactions of Water Molecules at Si-Dielectric Interfaces

Tsetseris, L., Zhou, X., Fleetwood, D. M., Schrimpf, R. D., Pantelides, S. T.

Materials Research Society
7 国際会議録 *THE ENCHANTING PROPERTIES OF OXYGEN ATOMS IN SILICON

Needels, M., Joannopoulos, J.D., Bar-Yam, Y., Pantelides, S.T., Wolfe, R.H.

Materials Research Society
2 国際会議録 Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs - Challenges and Advances

Pantelides, S.T., Wang, S., Franceschetti, A., Buczko, R., Di Ventra, M., Rashkeev, S.N., Tsetseris, L., Evans, M.H., …

Trans Tech Publications
8 国際会議録 Structural and Mechanical Properties of Boron Nanotubes

Evans, Matthew H., Joannopoulos, John D., Pantelides, Sokrates T.

Materials Research Society
3 国際会議録 Hydrogen Model for Negative Bias Temperature Instabilities in MOS Gate Dielectrics

Fleetwood, D.M., Zhou, X.J., Tsetseris, L., Pantelides, S.T., Schrimpf, R.D.

Electrochemical Society
9 国際会議録 Recent radiation issues in silicon-on-insulator devices

Alles, M.L., Ball, D.R., Schrimpf, R.D., Fleetwood, D.M., Reed, R.A., Jun, B.

Electrochemical Society
4 国際会議録 Dipoles in SiO2: Border Traps or Not?

Fleetwood, D.M., Rashkeev, S.N., Lu, Z.Y., Nicklaw, CJ., Felix, JA., Schrimpf, R.D., Pantelides, S.T.

Electrochemical Society
10 国際会議録 Investigation of second-harmonic generation for SOI wafer metrology

Pasternak, R., Jun, B., Schrimpf, R.D., Fleetwood, D.M., Alles, M.A., Dolan, R.P., Standley, R.W., Tolk, N.H.

Electrochemical Society
5 国際会議録 Atomic-Scale Simulations of Electron Mobilities in Ultrathin SOI MOSFETs

S. T. Pantelides, G. Hadjisavvas, M. Evans, L. Tsetseris, M. Caussanel, R. Schrimpf

Electrochemical Society
11 国際会議録 Chromium and Lanthanum on Transition Alumina Surfaces : The Role of Bulk Point-Defect Distributions on Catalytic

Rasnkeev, S.N., Sohlberg, K., Glazoff, M.V., Novak, J., Pennycook, S.J., Pantelides, S.T.

Materials Research Society
6 国際会議録 The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials

Pennycook, S.J., Kim, M., Duscher, G., Browning, N.D., Sohlberg, K., Pantelides, S. T.

Materials Research Society
12 国際会議録 Nanoscale Structure/Property Correlation Through Aberration-Corrected STEM and Theory

Pennycook, S.J., Lupini, A.R., Varela, M., Borisevich, A., Chisholm, M.F., Abe, E., Dellby, N., Krivanek, O.L., Nellist, …

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12