Comparison between Measurement Techniques Used for Determination of the Micropipe Density in SiC Substrates
- 著者名:
Emorhokpor, E. Carlson, E. Wan, J. Weber, A. Basceri, C. Jenny, J.R. Sandhu, R. Oliver, J.D. Burkeen, F. Somanchi, A. Velidandla, V. Orazio, F. Blew, A. Goorsky, M.S. Dudley, M. - 掲載資料名:
- Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 527-529
- 発行年:
- 2006
- パート:
- 1
- 開始ページ:
- 443
- 終了ページ:
- 446
- 総ページ数:
- 4
- 出版情報:
- Stafa-Zuerich: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878494255 [0878494251]
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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8
国際会議録
Characterization of Micropipes and Other Defect Structures in 6H-SiC Through Fluorescence Microscopy
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