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Degradation in Sn Films Due to Whisker Formation

著者名:
Reinbold, L.
Chason, Eric
Jadhav, N.
Kelly, V.
Holmers, P.
Shin, J.W.
Chan, W.L.
Kumar, K.S.
Barr, G.
さらに 4 件
掲載資料名:
Degradation processes in nanostructured materials : symposium held November 28-December 1, 2005, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
887
発行年:
2006
開始ページ:
197
終了ページ:
208
総ページ数:
12
出版情報:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558998414 [1558998411]
言語:
英語
請求記号:
M23500/887
資料種別:
国際会議録

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