Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface

Analysis of High Resolution Electron Microscope Images of the Pd2Si-Si Interface

著者名:: Krakow, W.
掲載資料名:: Thin films and interfaces : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A.
シリーズ名:: Materials Research Society symposium proceedings
シリーズ巻号:: 10
発行年:: 1982
開始ページ:: 111
終了ページ:: 128
総ページ数:: 18
出版情報:: New York: North-Holland
ISSN:: 02729172
ISBN:: 9780444007742 [0444007741]
言語:: 英語
請求記号:: M23500/10
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00015808
シリーズID:	PA00000011
会議名:	Materials Research Society annual meeting ; Symposium on thin films and interfaces
回次:	1981
会議開催地:	Boston, MA, USA
会議開催年:	1981.11.00

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