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X-RAY DIFFRACTION AND REFLECTANCE, RAMAN SCATTERING AND PHOTOLUMINESCENCE CHARACTERIZATION OF THERMALLY ANNEALED EPITAXIAL Si1-XGeX LAYERS

著者名:
Libezny, M.
De WoIf, I.
Poortmans, J.
Van Ammel, A.
Caymax, M.
Holy, V.
Vi-da, F.
Kub-na, J.
Werner, K.
Ishida, M.
さらに 5 件
掲載資料名:
Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
298
発行年:
1993
開始ページ:
51
終了ページ:
56
総ページ数:
6
出版情報:
Pittsburgh, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558991941 [1558991948]
言語:
英語
請求記号:
M23500/298
資料種別:
国際会議録

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