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IMAGING OF METAL/SEMICONDUCTOR INTERFACE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY (BEEM)

著者名:
掲載資料名:
Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
295
発行年:
1993
開始ページ:
231
終了ページ:
234
総ページ数:
4
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991903 [1558991905]
言語:
英語
請求記号:
M23500/295
資料種別:
国際会議録

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