ACCELERATED DEGRADATION MECHANISMS IN AMORPHOUS SILICON THIN FILM TRANSISTORS .
- 著者名:
Chung, I.J. Oh, C.H. Kim, W.Y. Hwang, J.Y. Kim, Y.S. Park, J.S. Lee, S.K. Han, M.K. - 掲載資料名:
- Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 284
- 発行年:
- 1993
- 開始ページ:
- 401
- 終了ページ:
- 406
- 総ページ数:
- 6
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991798 [1558991794]
- 言語:
- 英語
- 請求記号:
- M23500/284
- 資料種別:
- 国際会議録
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