EFFECT OF THE CRYSTALLOGRAPHIC ORIENTATION OF UNDERLYING POLY-Si ON THE THERMAL STABILITY OF THE TiSi2 FILM
- 著者名:
Kim, Y.W. Kim, I.K. Lee, N.I. Ko, J.W. Ahn, S.T. Lee, M.Y. Lee, J.G. - 掲載資料名:
- Evolution of surface and thin film microstructure : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 280
- 発行年:
- 1993
- 開始ページ:
- 599
- 終了ページ:
- 602
- 総ページ数:
- 4
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991750 [1558991751]
- 言語:
- 英語
- 請求記号:
- M23500/280
- 資料種別:
- 国際会議録
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