DISORDERING AND CHARACTERIZATION STUDIES OF 69 GaAs/71GaAs ISOTOPE SUPERLATTICES STRUCTURES: THE EFFECT OF OUTDIFFUSION OF THE SUBSTRATE DOPANT Si
- 著者名:
Tan, T. Y. You, H. M. Yu, S. Goesele, U. M. Jager, W. Zypman, F. Tsu, R. Lee, S.-T - 掲載資料名:
- Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 262
- 発行年:
- 1992
- 開始ページ:
- 873
- 終了ページ:
- 880
- 総ページ数:
- 8
- 出版情報:
- Pittsburgh, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558991576 [1558991573]
- 言語:
- 英語
- 請求記号:
- M23500/262
- 資料種別:
- 国際会議録
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