THE STUDY OF Si, Se AND O-IMPLANTED GaAs BY SLOW POSITRONS

THE STUDY OF Si, Se AND O-IMPLANTED GaAs BY SLOW POSITRONS

著者名:

掲載資料名:

Defect engineering in semiconductor growth, processing and device technology : symposium held April 26-May 1, 1992, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

262

発行年:

1992

開始ページ:

343

終了ページ:

348

総ページ数:

6

出版情報:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558991576 [1558991573]

言語:

英語

請求記号:

M23500/262

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00015746
シリーズID:	PA00000011
会議名:	Symposium on defect engineering in semiconductor growth, processing and device technology
回次:	1992
会議開催地:	San Francisco, CA, USA
会議開催年:	1992.04.26-1992.05.01

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2 国際会議録 The Study of Defects Induced by the Implantation of O Ions into GaAs by a Slow Positron Beam Fujii,S., Wei,L., Tanigawa,S. Trans Tech Publications	8 国際会議録 Monoenergetic Positron Beam Study of Heavily Si-doped GaAs Grown by MOCVD using Tertiarybutylarsine Chichibu,S., Iwai,A., Nakahara,Y., Matsumoto,S., Higuchi,H., Wei,L., Tanigawa,S. Trans Tech Publications
3 国際会議録 The Effect of Point Defects on the Electrical Activation of Si-Implanted GaAs During Rapid Thermal Annealing Studied by Slow Positrons Wei,L., Lee,J.L., Tanigawa,S., Nakagawa,T., Ohta,K. Trans Tech Publications	9 国際会議録 Monoenergetic Positron Beam Studies of Near Surface Defects Induced by Low Dose Be-Implantation Uedono,A., Wei,L., Tabuki,Y., Kondo,H., Tanigawa,S., Wada,K., Nakanishi,H. Trans Tech Publications
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