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FIBXTEM-FOCUSSED ION BEAM MILLING FOR TEM SAMPLE PREPARATION

著者名:
掲載資料名:
Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
254
発行年:
1992
開始ページ:
23
終了ページ:
42
総ページ数:
20
出版情報:
Pittsburgh: Materials Research Society
ISSN:
02729172
ISBN:
9781558991484 [1558991484]
言語:
英語
請求記号:
M23500/254
資料種別:
国際会議録

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