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*MICROSTRUCTURAL CHARACTERIZATION OF EPITAXIAL BOTTOM ELECTRODES, BUFFER LAYERS, AND FERROELECTRIC THIN FILMS

著者名:
Rou, S.H.
Graettinger, T.M.
Chow, A.F.
Soble, II, C.N.
Lichtenwalner, D.J.
Auciello, O.
Kingon, A.I.
さらに 2 件
掲載資料名:
Ferroelectric thin films II : symposium held December 2-4, 1991, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
243
発行年:
1992
開始ページ:
81
終了ページ:
92
総ページ数:
12
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991378 [1558991379]
言語:
英語
請求記号:
M23500/243
資料種別:
国際会議録

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