Blank Cover Image

*INVESTIGATION OF CVD-GROWN DIAMOND BY CATHODOLUMINESCENCE IN TEM

著者名:
Graham, R.J.  
掲載資料名:
Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A.
シリーズ名:
Materials Research Society symposium proceedings
シリーズ巻号:
242
発行年:
1992
開始ページ:
97
終了ページ:
108
総ページ数:
12
出版情報:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558991361 [1558991360]
言語:
英語
請求記号:
M23500/242
資料種別:
国際会議録

類似資料:

Adam, W., Bauer, C., Berdermann, E., Bogani, F., Borchi, E., Bruzzi, M., Colledani, C., Conway, J., Dabrowski, W., …

Electrochemical Society

Yew, T.R., Comfort, J.H., Garverick, L.M., Burger, W.R., Reif, R.

Materials Research Society

Rudder, R.A., Thomas, R.E., Hudson, G.C., Posthill, J.B., Malta, D.P., Markunas, R.J.

Electrochemical Society

Hsiao, H. L., Wang, K. C., Cheng, L. W., Yang, A. B., Yew, T. R., Hwang, H. L.

MRS - Materials Research Society

Shea,L.E., Walko,R.J.

SPIE - The International Society for Optical Engineering

Collins, A.T., Higgs, V., Wright, P.J.

Electrochemical Society

Nishimura. K, Das. K, Glass. T. J, Kobayashi. K, Nemanich. J. R

Kluwer Academic Publishers

Butler,J.E., Vestyck,D.J.,Jr., Gilmore,A., Steeds,J.W.

SPIE - The International Society for Optical Engineering

Wort,C.J.H., Pickles,C.S.J., Beale,A.C., Sweeney,C.G., McClymont,M.R., Saunders,R.J., Sussmann,R.S., Lewis,K.L.

SPIE - The International Society for Optical Engineering

Chen, Fred Y., King, Alexander H., Salat, Robert F., Fricano, Glenn J.

MRS - Materials Research Society

Kock, F.A.M., Garguilo, J.M., Brown, B., Nemanich, R.J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12